Effect of interface traps on Debye thickness semiconductor films

Sandomirsky, V. / Butenko, A. V. / Kolobov, I. G. et al. | British Library Online Contents | 2006

Simulation study of interface traps and bulk traps in n^+^+GaN/InAlN/AlN/GaN high electron mobility transistors

Molnar, M. / Donoval, D. / Kuzmik, J. et al. | British Library Online Contents | 2014

Simulation study of interface traps and bulk traps in n^+^+GaN/InAlN/AlN/GaN high electron mobility transistors

Molnar, M. / Donoval, D. / Kuzmik, J. et al. | British Library Online Contents | 2014

SiC MOSFET Channel Mobility Dependence on Substrate Doping and Temperature Considering High Density of Interface Traps

Perez-Tomas, A. / Jennings, M. R. / Mawby, P. A. et al. | British Library Online Contents | 2007

Effect of High Temperature Oxidation of 4H-SiC on the Near-Interface Traps Measured by TDRC

Allerstam, F. / Sveinbjornsson, E.O. | British Library Online Contents | 2009