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New fabrication of a strained Si/Si1-yGey dual channel on a relaxed Si1-xGex virtual substrate using a Ge-rich layer formed by oxidation
New fabrication of a strained Si/Si1-yGey dual channel on a relaxed Si1-xGex virtual substrate using a Ge-rich layer formed by oxidation
New fabrication of a strained Si/Si1-yGey dual channel on a relaxed Si1-xGex virtual substrate using a Ge-rich layer formed by oxidation
Kim, S. H. (author) / Bae, H. C. (author) / Lee, S. H. (author)
APPLIED SURFACE SCIENCE ; 254 ; 6025-6029
2008-01-01
5 pages
Article (Journal)
English
DDC:
621.35
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