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Relative quantification of cellular sections with molecular depth profiling ToF-SIMS imaging
Relative quantification of cellular sections with molecular depth profiling ToF-SIMS imaging
Relative quantification of cellular sections with molecular depth profiling ToF-SIMS imaging
Kurczy, M. E. (author) / Kozole, J. (author) / Parry, S. A. (author) / Piehowski, P. D. (author) / Winograd, N. (author) / Ewing, A. G. (author)
APPLIED SURFACE SCIENCE ; 255 ; 1158-1161
2008-01-01
4 pages
Article (Journal)
English
DDC:
621.35
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