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Reflection absorption infrared spectroscopy during atomic layer deposition of HfO2 films from tetrakis(ethylmethylamido)hafnium and water
Reflection absorption infrared spectroscopy during atomic layer deposition of HfO2 films from tetrakis(ethylmethylamido)hafnium and water
Reflection absorption infrared spectroscopy during atomic layer deposition of HfO2 films from tetrakis(ethylmethylamido)hafnium and water
Sperling, B. A. (author) / Kimes, W. A. (author) / Maslar, J. E. (author)
APPLIED SURFACE SCIENCE ; 256 ; 5035-5041
2010-01-01
7 pages
Article (Journal)
English
DDC:
621.35
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