Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Reflection absorption infrared spectroscopy during atomic layer deposition of HfO2 films from tetrakis(ethylmethylamido)hafnium and water
Reflection absorption infrared spectroscopy during atomic layer deposition of HfO2 films from tetrakis(ethylmethylamido)hafnium and water
Reflection absorption infrared spectroscopy during atomic layer deposition of HfO2 films from tetrakis(ethylmethylamido)hafnium and water
Sperling, B. A. (Autor:in) / Kimes, W. A. (Autor:in) / Maslar, J. E. (Autor:in)
APPLIED SURFACE SCIENCE ; 256 ; 5035-5041
01.01.2010
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
British Library Online Contents | 2012
|British Library Online Contents | 2007
|Hafnium silicon oxide films prepared by atomic layer deposition
British Library Online Contents | 2004
|Silicon surface passivation using thin HfO2 films by atomic layer deposition
British Library Online Contents | 2015
|Atomic layer deposition of hafnium and zirconium silicate thin films
British Library Online Contents | 2003
|