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Structural Characterisation of Er Implanted, Ge-Rich SiO~2 Layers Using Slow Positron Implantation Spectroscopy
Structural Characterisation of Er Implanted, Ge-Rich SiO~2 Layers Using Slow Positron Implantation Spectroscopy
Structural Characterisation of Er Implanted, Ge-Rich SiO~2 Layers Using Slow Positron Implantation Spectroscopy
Anwand, W. (author) / Kanjilal, A. (author) / Brauer, G. (author) / Wagner, A. (author) / Butterling, M. (author) / Cowan, T.E. (author) / Rebohle, L. (author) / Skorupa, W. (author) / Zaleski, R.
2011-01-01
5 pages
Article (Journal)
English
DDC:
620.11
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