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Photoluminescence Imaging and Wavelength Analysis of Basal Plane Frank-Type Defects in 4H-SiC Epilayers
Photoluminescence Imaging and Wavelength Analysis of Basal Plane Frank-Type Defects in 4H-SiC Epilayers
Photoluminescence Imaging and Wavelength Analysis of Basal Plane Frank-Type Defects in 4H-SiC Epilayers
Kamata, I. (author) / Zhang, X. (author) / Tsuchida, H. (author) / Yamada-Kaneta, H. / Sakai, A.
2012-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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