SiC MOSFET Reliability Update: Fid-Bau Portal

SiC MOSFET Reliability Update

Das, M.K. / Haney, S. / Richmond, J. / Olmedo, A. / Zhang, Q. / Ring, Z.

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SiC MOSFET Reliability Update

Das, M.K. / Haney, S. / Richmond, J. / Olmedo, A. / Zhang, Q. / Ring, Z.

SiC MOSFET Reliability Update

Das, M.K. / Haney, S. / Richmond, J. / Olmedo, A. / Zhang, Q. / Ring, Z.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

SiC MOSFET Reliability Update

Contributors:

Das, M.K. (author) / Haney, S. (author) / Richmond, J. (author) / Olmedo, A. (author) / Zhang, Q. (author) / Ring, Z. (author)

Published in:

MATERIALS SCIENCE FORUM ; 717/720 ; 1073-1076

Publication date:

2012-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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