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    High Temperature Reliability of the SiC-MOSFET with Copper Metallization

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    High Temperature Reliability of the SiC-MOSFET with Copper Metallization

    New search for: Okabe, H.
    New search for: Yoshida, M.
    New search for: Tominaga, T.
    New search for: Fujita, J.
    New search for: Endo, K.
    New search for: Yokoyama, Y.
    New search for: Nishikawa, K.
    New search for: Toyoda, Y.
    New search for: Yamakawa, S.
    New search for: Okumura, H.
    New search for: Harima, H.
    New search for: Kimoto, T.
    New search for: Yoshimoto, M.
    New search for: Watanabe, H.
    New search for: Hatayama, T.
    New search for: Matsuura, H.
    New search for: Funaki, T.
    New search for: Sano, Y.

    Access

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    High Temperature Reliability of the SiC-MOSFET with Copper Metallization

    New search for: Okabe, H.
    New search for: Yoshida, M.
    New search for: Tominaga, T.
    New search for: Fujita, J.
    New search for: Endo, K.
    New search for: Yokoyama, Y.
    New search for: Nishikawa, K.
    New search for: Toyoda, Y.
    New search for: Yamakawa, S.
    New search for: Okumura, H.
    New search for: Harima, H.
    New search for: Kimoto, T.
    New search for: Yoshimoto, M.
    New search for: Watanabe, H.
    New search for: Hatayama, T.
    New search for: Matsuura, H.
    New search for: Funaki, T.
    New search for: Sano, Y.

    Access

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    Title:

    High Temperature Reliability of the SiC-MOSFET with Copper Metallization

    Contributors:

    Okabe, H. (author) / Yoshida, M. (author) / Tominaga, T. (author) / Fujita, J. (author) / Endo, K. (author) / Yokoyama, Y. (author) / Nishikawa, K. (author) / Toyoda, Y. (author) / Yamakawa, S. (author) / Okumura, H.

    Published in:

    Silicon Carbide and Related Materials 2013 ; 955-958

    MATERIALS SCIENCE FORUM ; 778/780

    Publication date:

    2014-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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