Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Al^+ Implanted 4H-SiC: Improved Electrical Activation and Ohmic Contacts

    New search for: Nipoti, R.
    New search for: Hallen, A.
    New search for: Parisini, A.
    New search for: Moscatelli, F.
    New search for: Vantaggio, S.
    New search for: Lebedev, A.A.
    New search for: Davydov, S.Y.
    New search for: Ivanov, P.A.
    New search for: Levinshtein, M.E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Al^+ Implanted 4H-SiC: Improved Electrical Activation and Ohmic Contacts

    New search for: Nipoti, R.
    New search for: Hallen, A.
    New search for: Parisini, A.
    New search for: Moscatelli, F.
    New search for: Vantaggio, S.
    New search for: Lebedev, A.A.
    New search for: Davydov, S.Y.
    New search for: Ivanov, P.A.
    New search for: Levinshtein, M.E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Al^+ Implanted 4H-SiC: Improved Electrical Activation and Ohmic Contacts

    New search for: Nipoti, R.
    New search for: Hallen, A.
    New search for: Parisini, A.
    New search for: Moscatelli, F.
    New search for: Vantaggio, S.
    New search for: Lebedev, A.A.
    New search for: Davydov, S.Y.
    New search for: Ivanov, P.A.
    New search for: Levinshtein, M.E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Al^+ Implanted 4H-SiC: Improved Electrical Activation and Ohmic Contacts

    Contributors:

    Nipoti, R. (author) / Hallen, A. (author) / Parisini, A. (author) / Moscatelli, F. (author) / Vantaggio, S. (author) / Lebedev, A.A. / Davydov, S.Y. / Ivanov, P.A. / Levinshtein, M.E.

    Published in:

    Silicon Carbide and Related Materials 2012 Selected, peer reviewed papers from the 9th European Conference on Silicon Carbide and Related Materials (ECSCRM 2012), September 2-6, 2012, St. Petersburg, Russian Federation ; 767-772

    MATERIALS SCIENCE FORUM ; 740/742

    Publication date:

    2013-01-01

    Size:

    6 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Carbon-Cap for Ohmic Contacts on n-Type Ion Implanted 4H-SiC

    Nipoti, R. / Mancarella, F. / Moscatelli, F. et al. | British Library Online Contents | 2011

    Improved AlNi Ohmic Contacts to p-Type SiC

    Tsao, B. H. / Liu, S. / Scofield, J. | British Library Online Contents | 2004

    Effects of cap layer on ohmic Ti/Al contacts to Si+ implanted GaN

    Placidi, M. / Perez-Tomas, A. / Constant, A. et al. | British Library Online Contents | 2009

    Searching for Device Processing Compatible Ohmic Contacts to Implanted p-Type 4H-SiC

    Luo, Y. / Yan, F. / Tone, K. et al. | British Library Online Contents | 2000

    Impact of Surface Morphology on the Electrical Properties of Al/Ti Ohmic Contacts on Al-Implanted 4H-SiC

    Frazzetto, A. / Roccaforte, F. / Giannazzo, F. et al. | British Library Online Contents | 2011

    Back to top