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Characterization of SiO~2/SiC Interfaces Annealed in N~2O or POCl~3
Characterization of SiO~2/SiC Interfaces Annealed in N~2O or POCl~3
Characterization of SiO~2/SiC Interfaces Annealed in N~2O or POCl~3
Fiorenza, P. (author) / Swanson, L.K. (author) / Vivona, M. (author) / Giannazzo, F. (author) / Bongiorno, C. (author) / Lorenti, S. (author) / Frazzetto, A. (author) / Roccaforte, F. (author) / Okumura, H. / Harima, H.
2014-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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