Seebeck Coefficient of Ge-on-Insulator Layers Fabricated by Direct Wafer Bonding Process

Manimuthu, V. / Yoshida, S. / Suzuki, Y. et al. | British Library Conference Proceedings | 2015

Fabrication of SiGe-on-insulator by rapid thermal annealing of Ge on Si-on-insulator substrate

Kutsukake, K. / Usami, N. / Fujiwara, K. et al. | British Library Online Contents | 2004

Ge-on-insulator wafer with ultralow defect density fabricated by direct condensation of SiGe-on-insulator structure

Ye, Lin / Zhang, Miao / Xue, Zhongyin et al. | British Library Online Contents | 2015

Ge-on-insulator wafer with ultralow defect density fabricated by direct condensation of SiGe-on-insulator structure

Ye, L. / Zhang, M. / Xue, Z. et al. | British Library Online Contents | 2015

Semiconductor Wafer Bonding

Goesele, U. / Tong, Q.-Y. | British Library Online Contents | 1998