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Wet-Etching Characteristics of SiCN Films Deposited by HWCVD Method
Wet-Etching Characteristics of SiCN Films Deposited by HWCVD Method
Wet-Etching Characteristics of SiCN Films Deposited by HWCVD Method
Nakanishi, H. (Autor:in) / Ogata, T. (Autor:in) / Kadotani, Y. (Autor:in) / Izumi, A. (Autor:in) / Vincenzini, P. / Lorenzelli, L.
Symposium, Next generation micro/nano systems; of CIMTEC 2012 ``Smart materials, structures and systems'' ; 2012 ; Montecatini Terme, Italy
01.01.2013
5 pages
Includes bibliographical references and index
Aufsatz (Konferenz)
Englisch
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