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Reliability and Degradation of Metal-Oxide-Semiconductor Capacitors on 4H- and 6H-Silicon Carbide
Reliability and Degradation of Metal-Oxide-Semiconductor Capacitors on 4H- and 6H-Silicon Carbide
Reliability and Degradation of Metal-Oxide-Semiconductor Capacitors on 4H- and 6H-Silicon Carbide
Treu, M. (Autor:in) / Schorner, R. (Autor:in) / Friedrichs, P. (Autor:in) / Rupp, R. (Autor:in) / Wiedenhofer, A. (Autor:in) / Stephani, D. (Autor:in) / Ryssel, H. (Autor:in)
MATERIALS SCIENCE FORUM ; 338/342 ; 1089-1092
01.01.2000
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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