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Growth analysis of interfacial delamination in a plastic ball grid array package during solder reflow using the global-local finite element model
Growth analysis of interfacial delamination in a plastic ball grid array package during solder reflow using the global-local finite element model
Growth analysis of interfacial delamination in a plastic ball grid array package during solder reflow using the global-local finite element model
Chang, K.-C. (Autor:in) / Chiang, K.-N. (Autor:in)
JOURNAL OF STRAIN ANALYSIS FOR ENGINEERING DESIGN ; 41 ; 19-30
01.01.2006
12 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
624.176
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