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Structural characterization of SiGe nanoclusters formed by rapid thermal annealing
Structural characterization of SiGe nanoclusters formed by rapid thermal annealing
Structural characterization of SiGe nanoclusters formed by rapid thermal annealing
dos Anjos, A. M. (Autor:in) / Doi, I. (Autor:in) / Diniz, J. A. (Autor:in)
APPLIED SURFACE SCIENCE ; 254 ; 6055-6058
01.01.2008
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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