Low Energy Proton Radiation Impact on 4H-SiC nMOSFET Gate Oxide Stability

Florentin, M. / Alexandru, M. / Constant, A. et al. | British Library Online Contents | 2014

Hot carrier stress in 70-nm nMOSFET with various bias conditions

Hyun-Sik Choi, / Seung-Ho Hong, / Hee-Sung Kang, et al. | IEEE | 2006

Self-Aligned N+ Polysilicon-Gate GaN MOSFETs

Matocha, K. / Chow, T. P. / Gutmann, R. J. | British Library Online Contents | 2004

Low leakage and high performance of nMOSFET using SiGe layer as a diffusion barrier

Mheen, B. / Song, Y. J. / Kang, J. Y. et al. | British Library Online Contents | 2004

TCAD Optimisation of 4H-SiC Channel-Doped MOSFET with P-Polysilicon Gate

Adachi, K. / Johnson, C. M. / Arai, K. et al. | British Library Online Contents | 2002