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Characterization of oxygen and nitrogen rapid thermal annealing processes for ultra-low-k SiCOH films
Characterization of oxygen and nitrogen rapid thermal annealing processes for ultra-low-k SiCOH films
Characterization of oxygen and nitrogen rapid thermal annealing processes for ultra-low-k SiCOH films
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 23 ; 856-861
2008-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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