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Thermal reliability of thin SiGe epilayers
Thermal reliability of thin SiGe epilayers
Thermal reliability of thin SiGe epilayers
Wu, M. J. (author) / Wen, H. C. (author) / Chiang, T. Y. (author) / Tsai, C. H. (author) / Hsu, W. K. (author) / Chou, C. P. (author)
APPLIED SURFACE SCIENCE ; 258 ; 5001-5004
2012-01-01
4 pages
Article (Journal)
English
DDC:
621.35
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