A platform for research: civil engineering, architecture and urbanism
High-Resolution TEM Observation of 4H-SiC (0001) Surface Planarized by Catalyst-Referred Etching
High-Resolution TEM Observation of 4H-SiC (0001) Surface Planarized by Catalyst-Referred Etching
High-Resolution TEM Observation of 4H-SiC (0001) Surface Planarized by Catalyst-Referred Etching
Pho, B.V. (author) / Sadakuni, S. (author) / Okamoto, T. (author) / Sagawa, R. (author) / Arima, K. (author) / Sano, Y. (author) / Yamauchi, K. (author)
MATERIALS SCIENCE FORUM ; 717/720 ; 873-876
2012-01-01
4 pages
Article (Journal)
English
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Surface Observation of 4H-SiC (0001) Planarized by Catalyst-Referred Etching
British Library Online Contents | 2012
|TEM Observation of 8 Deg Off-Axis 4H-SiC (0001) Surfaces Planarized by Catalyst-Referred Etching
British Library Online Contents | 2011
|Study of Terminated Species on 4H-SiC (0001) Surfaces Planarized by Catalyst-Referred Etching
British Library Online Contents | 2013
|Damage-Free Planarization of 4H-SiC (0001) by Catalyst-Referred Etching
British Library Online Contents | 2007
|Reduction of Surface Roughness of 4H-SiC by Catalyst-Referred Etching
British Library Online Contents | 2010
|